IEC-PAS-62165
|
2000
|
Guidelines for the Measurement of Thermal Resistance of GaAs FETs Edition 1.0
|
IEC-PAS-62166
|
2000
|
Guidelines for User Notification of Product/Process Changes by Semiconductor Suppliers Edition 1.0
|
IEC-PAS-62167
|
2000
|
Product Discontinuance Edition 1.0
|
IEC-PAS-62168
|
2000
|
Symbol and Labels for Moisture-Sensitive Devices Edition 1.0
|
IEC-PAS-62169
|
2000
|
Standard for Handling, Packing, Shipping and Use of Moisture/Reflow Sensitive Surface Mount Devices
|
IEC-PAS-62170
|
2000
|
Bond Wire Modeling Standard Edition 1.0
|
IEC-PAS-62171
|
2000
|
Guidelines for Particle Impact Noise Detection (PIND) Testing, Operator Training and Certification E
|
IEC-PAS-62172
|
2000
|
Accelerated Moisture Resistance - Unbiased Autoclave Edition 1.0
|
IEC-PAS-62173
|
2000
|
Solderability Test Method Edition 1.0
|
IEC-PAS-62174
|
2000
|
Resistance to Soldering Temperature for Through-Hole Mounted Devices Edition 1.0
|
IEC-PAS-62178
|
2000
|
Temperature Cycling Edition 1.0
|
IEC-PAS-62179
|
2000
|
Electrostatic Discharge (ESD) Sensitivity Testing Human Body Model (HBM) Edition 1.0
|
IEC-PAS-62180
|
2000
|
Electrostatic Discharge (ESD) Sensitivity Testing Machine Model (MM) Edition 1.0
|
IEC-PAS-62181
|
2000
|
IC Latch-Up Test Edition 1.0
|
IEC-PAS-62182
|
2000
|
Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing Edition 1.0
|
IEC-PAS-62184
|
2000
|
Lead Integrity Test Method Edition 1.0
|
IEC-PAS-62189
|
2000
|
Bias Life Edition 1.0
|
IEC-PAS-62190
|
2000
|
Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices Edition
|
IEC-PAS-62191
|
2000
|
Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components Edition 1.0
|
IEC-PAS-62201
|
2000
|
A Procedure for Executing SWEAT Edition 1.0
|
IEC-PAS-62202
|
2000
|
Failure Mechanisms and Models for Silicon Semiconductor Devices Edition 1.0
|
IEC-PAS-62203
|
2000
|
Guide for Standard Probe Pad Sizes and Layouts for Water-Level Electrical Testing Edition 1.0
|
IEC-PAS-62204
|
2000
|
Standard Method for Measuring and Using the Temperature Coefficient of Resistance to Determine the T
|
IEC-PAS-62206
|
2000
|
Power and Temperature Cycling Edition 1.0
|
IEC-PAS-62212
|
2001
|
Specification and Characterization Methods for Nonwoven "E" Glass Mat Edition 1.0
|
IEC-PAS-62213
|
2001
|
Specification and Characterization Methods for Nonwoven Para-Aramid Reinforcement Edition 1.0
|
IEC-PAS-62214
|
2001
|
Generic Performance Specification for Printed Boards Edition 1.0
|
IEC-PAS-62239
|
2001
|
Electronic Component Management Plans Edition 1.0
|
IEC-PAS-62240
|
2001
|
Use of Semiconductor Devices Outside Manufacturer's Specified Temperature Ranges Edition 1.0
|
IEC-PAS-62249
|
2001
|
Qualification and Performance Specification for Flexible Printed Boards Edition 1.0
|
IEC-PAS-62250
|
2001
|
Qualification and Performance Specification for Rigid Printed Boards Edition 1.0
|
IEC-PAS-62260
|
2001
|
Pulse/Step Return Loss from Measurement in the Frequency Domain Using the Inverse Discrete Fourier T
|
IEC-PAS-62261
|
2001
|
Television - Metadata Dictionary Structure Edition 1.0
|
IEC-PAS-62271-109
|
2002
|
High-Voltage Switchgear and Controlgear - Part 109: Alternating-Current Series Capacitor By-Pass Swi
|
IEC-PAS-62272-1
|
2002
|
Digital Radio Mondiale (DRM) - System Specification for Digital Transmissions in the Broadcasting Ba
|
IEC-PAS-62276
|
2001
|
Single Crystal Wafers Applied for Surface Acoustic Wave Device - Specification and Measuring Method
|
IEC-PAS-62277
|
2001
|
Test-Fixture of Surface Mounting Quartz Crystal Units Edition 1.0
|
IEC-PAS-62292
|
2001
|
Draft SMPTE Engineering Guideline SMPTE XXX - Declarative Data Essence Edition 1.0
|
IEC-PAS-62297
|
2002
|
Proposal for Introducing a Trigger Mechanism into TV Transmissions Edition 1.0; EACEM TR-037-R01:200
|
IEC-PAS-62298
|
2002
|
TeleWeb Application Profile 1 Reference Decoder Edition 1.0; EACEM TR-045-R01:2001
|
IEC-PAS-62307
|
2002
|
Test Method for the Measurement of Moisture Diffusivity and Water Solubility in Organic Materials Us
|
IEC-PAS-62323
|
2002
|
Dimensions of Half Pot Cores Made of Magnetic Oxides for Inductive proximity Switches Edition 1.0
|
IEC-PAS-62336
|
2002
|
Accelerated Moisture Resistance - Unbaised HAST Edition 1.0
|
IEC-PAS-62337
|
2002
|
Milestones and Activities During Commissioning of Electrical Instrumentation and Control Systems in
|
IEC-PAS-62338
|
2002
|
Screened balanced cables Coupling attenuation measurement, triaxial method
|
IEC-PAS-62443-3
|
2000
|
Security for industrial process measurement and control - Network and system security - Edition 1.0
|
IEC-PAS-62453-2
|
2006
|
PUBLICLY AVAILABLE SPECIFICATION Pre-Standard,Field Device Tool (FDT) interface specification –Part
|
IEC-PAS-62453-3
|
2006
|
PUBLICLY AVAILABLE SPECIFICATION Pre-Standard,Field Device Tool (FDT) interface specification –Part
|
IEC-PAS-62453-5
|
2006
|
PUBLICLY AVAILABLE SPECIFICATION Pre-Standard,Field Device Tool (FDT) interface specification –Part
|
IEC-PAS-62483
|
2006
|
PUBLICLY AVAILABLE SPECIFICATION, Test method for measuring whisker growth on tin and tin alloy surf
|