|
IEC-IECEX-TR-61241
|
2000
|
IECEx Test Report for IEC 61241-4 ed 1.0 (2001) - Electrical apparatus for use in presence of combus
|
|
IEC-IECEX-TR-62086
|
2000
|
IECEx Test Report for IEC 62086-1 (2001) ed 1.0 - Electrical apparatus for explosive gas atmospheres
|
|
IEC-IECQ-001002-1
|
2000
|
IEC Quality Assessment System for Electronic Components (IECQ) - Rules of Procedure Part 1: Administ
|
|
IEC-IECQ-001002-2
|
2000
|
IEC Quality Assessment System for Electronic Components (IECQ) Rules of Procedure Part 2: Documentat
|
|
IEC-IECQ-001002-3
|
2000
|
Rules of Procedure of the IEC Quality Assessment System for Electronic Components (IECQ) Part 3 : Ap
|
|
IEC-IECQ-001002-4
|
2000
|
IEC Quality Assessment System for Electronic Components (IECQ) Rules of Procedure - Part 4: Avionics
|
|
IEC-IECQ-001002-5
|
2000
|
IEC Quality Assessment System for Electronic Components (IECQ Scheme) Rules of Procedure - Part 5: H
|
|
IEC-IECQ-01
|
2000
|
IEC Quality Assessment System for Electronic Components (IECQ System) - Basic Rules - Edition 4.1
|
|
IEC-IECQ-01A
|
2000
|
IECQ Guide - Guidance for the use of the IECQ Logo and IECQ Mark of Conformity - Edition 2.0
|
|
IEC-IECQ-02
|
2000
|
Rules of Procedure – General requirements for the acceptance of IECQ Certification Bodies into the
|
|
IEC-IECQ-03-1
|
2000
|
IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure – Part
|
|
IEC-IECQ-03-2
|
2000
|
IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure – Part
|
|
IEC-IECQ-03-3
|
2000
|
IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure – Part
|
|
IEC-IECQ-03-3-1
|
2000
|
IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure – Part
|
|
IEC-IECQ-03-3-2
|
2000
|
IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure – Part
|
|
IEC-IECQ-03-4
|
2000
|
IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure – Part
|
|
IEC-IECQ-03-5
|
2000
|
IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure – Part
|
|
IEC-IECQ-03-6
|
2000
|
IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure – Part
|
|
IEC-IECQ-03-7
|
2000
|
Rules of Procedure – Part 7: IECQ Counterfeit Avoidance Programme (IECQ AP-CAP) – Programme Requ
|
|
IEC-IECQ-04-1
|
2000
|
Standard Training - Part 1: IECQ Training Body Requirements and Process for IECQ Acceptance - Editio
|
|
IEC-IECQ-04-5
|
2000
|
Standard Training - Part 5: Standard operational procedures for conducting IECQ HSPM Training - Edit
|
|
IEC-IECQ-CS-033200
|
2000
|
IEC Quality Assessment System for Electronic Components (IECQ System) Touch panels: Resistive touch
|
|
IEC-MISC-UNCERT
|
1995
|
Guide to the Expression of Uncertainty in Measurement First Edition; Corrected and Reprinted 1995
|
|
IEC-PAS-61076-3-10
|
2002
|
Connectors for Electronic Equipment - Part 3-104: Detail Specification for 8-Way, Shielded Free and
|
|
IEC-PAS-61076-3-11
|
2002
|
Connectors for Electronic Equipment - Part 3-111: Detail Specification 8-Way, Shielded and Unshielde
|
|
IEC-PAS-61076-4-11
|
2001
|
Connectors for Electronic Equipment - Part 4-115: Printed Board Connectors - Detail Specification fo
|
|
IEC-PAS-61169-4
|
2006
|
PUBLICLY AVAIL. SPEC. Pre-Standard,Radio-freq.connectors–Part4:Sec.spec.-Radio-freq.coaxial connc.wi
|
|
IEC-PAS-61169-43
|
2000
|
Radio-frequency connectors - Part 43: Sectional specification for RBMA series blind mating RF coaxia
|
|
IEC-PAS-61290-3-1
|
2002
|
Optical Fibre Amplifiers - Basic Specification - Part 3-1: Test Methods for Noise Figure Parameters
|
|
IEC-PAS-61300-3-29
|
2002
|
PRE-STANDARD Fibre Optic Interconnecting Devices and Passive Components - Basic Test and Measurement
|
|
IEC-PAS-61300-3-35
|
2002
|
Fibre Optic Interconnecting Devices and Passive Components - Basic Test and Measurement Procedures -
|
|
IEC-PAS-61338-2
|
2000
|
Waveguide Type Dielectric Resonators - Part 2: Guide to the Use of Waveguide Type Dielectric Resonat
|
|
IEC-PAS-61449-4
|
2002
|
Function Blocks for Industrial-Process Measurement and Control Systems - Part 4: Rules for Complianc
|
|
IEC-PAS-61499-1
|
2000
|
Function Blocks for Industrial-Process Measurement and Control Systems Part 1: Architecture Edition
|
|
IEC-PAS-61499-2
|
2001
|
Function Blocks for Industrial-Process Measurement and Control Systems - Part 2: Software Tools Requ
|
|
IEC-PAS-61499-4
|
2002
|
Function blocks for industrial-process measurement and control systems Part 4: Rules for compliance
|
|
IEC-PAS-61753-088
|
2000
|
Fibre optic interconnecting devices and passive components performance standard - Part 088-2: Non-co
|
|
IEC-PAS-61754-20
|
2001
|
Fibre Optic Connectors Interfaces - Part 20: Type LC Connector Family Edition 1.0
|
|
IEC-PAS-61883-6
|
1998
|
Consumer Audio/Video Equipment - Digital Interface - Part 6: Audio and Music Data Transmission Proto
|
|
IEC-PAS-61883-7
|
2001
|
Consumer Audio/Video Equipment - Digital Interface - Part 7: Transmission of Rec. ITU-R BO. 1294 Sys
|
|
IEC-PAS-62084
|
1998
|
Implementation of Flip Chip and Chip Scale Technology Edition 1.0
|
|
IEC-PAS-62085
|
1998
|
Implementation of Ball Grid Array and Other High Density Technology Edition 1.0
|
|
IEC-PAS-62111
|
1999
|
Specifications For The Use Of Renewable Energies In Rural Decentralised Electification Edition 1.0
|
|
IEC-PAS-62119
|
1999
|
Generic Requirements for Implementation of Product Manufacturing Description Data and Transfer Metho
|
|
IEC-PAS-62123
|
1999
|
Performance Guide Manual for Single- and Double-Sided Flexible Printed Wiring Boards Editiom 1.0
|
|
IEC-PAS-62159
|
2000
|
Electronic Assembly Manufacturers' Qualification Profile (AQP) Edition 1.0
|
|
IEC-PAS-62160
|
2000
|
Laminator Qualification Profile Edition 1.0
|
|
IEC-PAS-62161
|
2000
|
Steady State Temperature Humidity Bias Life Test Edition 1.0
|
|
IEC-PAS-62162
|
2000
|
Field-Induced Charged-Device Model Test Method for Electrostatic Discharge Withstand Thresholds of M
|
|
IEC-PAS-62164
|
2000
|
Guidelines for GaAs MMIC and FET Life Testing Edition 1.0
|
