فهرست استانداردها

Records 25101 to 25150 of 49613
کد استاندارد
سال
عنوان
DIN-5034-1 1983 Daylight in Interiors; General Requirements February
DIN-5034-2 1985 Daylight in Interiors; Principles February
DIN-5034-3 1994 Daylight in Interiors; Methods of Calculation September
DIN-5034-4 1994 Daylight in Interiors; Simplified Method of Determining Window Sizes in Dwellings September
DIN-50351 1985 Testing of Metallic Materials; Brinell Hardness Test (Feb) (Superseded by DIN EN 10003-1, January 19
DIN-5035-1 1990 Artificial Lighting; Terminology and General Requirements June
DIN-5035-2 1990 Artificial lighting; recommended values for lighting parameters for indoor and outdoor workspaces
DIN-5035-3 1988 Artificial lighting of interiors; hospital lighting
DIN-5035-4 1983 Artificial lighting of interiors; special recommendations for lighting educational establishments
DIN-5035-5 1987 Artificial Lighting of Interiors; Emergency Lighting December
DIN-5035-6 1990 Artificial lighting; measurement and evaluation
DIN-5035-7 1988 Artificial lighting of interiors; lighting of rooms with VDU work stations or VDU assisted workplace
DIN-50359-1 1997 Universal Hardness Testing of Metallic Materials - Test Method October
DIN-504 1973 Driving Components; Eye-Mounted Bearings July
DIN-50431 1988 Testing of Semiconductor Materials; Measurement of the Resistivity of Silicon or Germanium Single Cr
DIN-50434 1986 Testing of Materials for Semiconductor Technology; Detection of Crystal Defects in Monocrystalline S
DIN-50435 1988 Testing of Semiconductor Materials; Determination of the Radial Resistivity Variation of Silicon or
DIN-50438-1 1995 Determination of Interstitial Oxygen Content of Silicon Intended for Use in Semiconductor Technology
DIN-50438-3 1984 Testing of Materials for Use in Semiconductor Technology; Determination of Interstitial Atomic Boron
DIN-50441-1 1996 Determining the Dimensions of Semiconductor Wafers Part 1: Thickness and Thickness Variation July
DIN-50443-1 1988 Testing of Materials for Use in Semiconductor Technology; Detection of Crystal Defects and Inhomogen
DIN-50443-2 1994 Detection of Defects and Inhomogeneities in Monocrystalline III-V Compound Semiconductors by X-Ray T
DIN-50445 1992 Contactless Determination of the Resistivity of Homogeneously-Doped Semiconductor Slices with the Ed
DIN-50446 1995 Identification of Defects and Determination of Their Densities in Silicon Epitaxial Layers September
DIN-50447 1995 Contactless Measurement of Sheet Resistance of Semiconductor Layers Using the Eddy Current Induction
DIN-50448 1998 Determination of the Resistivity of Semi-Insulating Semiconductors Using a Capacitor January
DIN-50449-1 1997 Determination of Impurities in III-V Compound Semiconductors by Infrared Absorption Part 1: Carbon i
DIN-50449-2 1998 Determination of Impurities in III-V Compound Semiconductors by Infrared Absorption Part 2: Boron in
DIN-50450-6 1994 Determination of CO and CO2 Impurities in Nitrogen; Used as Carrier Gas and Doping Gas in Semiconduc
DIN-50450-7 1995 Determination of CO and H2 Impurities in Nitrogen; Used as Carrier Gas and Doping Gas in Semiconduct
DIN-50451-2 1990 Determination of Cobalt, Chromium, Copper, Iron and Nickel as Impurities in Hydrofluoric Acid for Us
DIN-50452-1 1995 Particle Analysis of Liquids for Use in Semiconductor Technology by the Microscopic Particle Determi
DIN-50452-2 1991 Particle Analysis of Liquids for Use in Semiconductor Technology Using Optical Particle Counters (Ma
DIN-50453-1 1990 Gravimetric Determination of Etch Rate of Mixtures for Etching Silicon Single Crystals for Use in Se
DIN-50453-2 1990 Spectrophotometric Determination of Etch Rate of Mixtures for Etching Silicon Dioxide Coatings for U
DIN-50460 1988 Determination of Magnetic Properties of Soft Magnetic Materials; General, Terminology and Principles
DIN-50463 1985 Testing of Steel; Determination of the Density of Iron/Silicon Alloy Magnetic Sheet (July)
DIN-50470 1980 Testing of Permanent Magnet Materials; Determination of the Demagnetization Curve and Permanent Perm
DIN-50502 1998 Determination of Copper Content of Unalloyed Copper Containing Not Less Than 99,90% of Copper May
DIN-50503 1998 Determination of Copper Content of Wrought and Cast Copper Alloys May
DIN-50511 1994 Determination of Phosphorus Content of Copper and Copper Alloys by the Molybdovanadate Spectrometric
DIN-50551 1990 Determination of the Lead, Cadmium and Copper Content of Zinc and Zinc Alloys by Atomic Absorption S
DIN-50600 1980 Testing of Metallic Materials; Metallographic Micrographs; Picture Scales and Formats (Mar)
DIN-50601 1985 Metallographic Examination; Determination of the Ferritic or Austenitic Grain Size of Steel and Ferr
DIN-50602 1985 Metallographic Examination; Microscopic Examination of Special Steels Using Standard Diagrams to Ass
DIN-508 1997 T-Nuts January
DIN-509 1966 Undercuts August
DIN-50900-1 1982 Corrosion of Metals; Terminology; General Concepts (Apr)
DIN-50902 1994 Protective Coatings on Metals; Concepts, Application Methods and Surface Preparation (Jul)
DIN-50903 1967 Metallic Coatings; Pores, Inclusions, Blisters and Cracks; Definitions (Jan)
Count 50    
Web hosting by Somee.com