DIN-5034-1
|
1983
|
Daylight in Interiors; General Requirements February
|
DIN-5034-2
|
1985
|
Daylight in Interiors; Principles February
|
DIN-5034-3
|
1994
|
Daylight in Interiors; Methods of Calculation September
|
DIN-5034-4
|
1994
|
Daylight in Interiors; Simplified Method of Determining Window Sizes in Dwellings September
|
DIN-50351
|
1985
|
Testing of Metallic Materials; Brinell Hardness Test (Feb) (Superseded by DIN EN 10003-1, January 19
|
DIN-5035-1
|
1990
|
Artificial Lighting; Terminology and General Requirements June
|
DIN-5035-2
|
1990
|
Artificial lighting; recommended values for lighting parameters for indoor and outdoor workspaces
|
DIN-5035-3
|
1988
|
Artificial lighting of interiors; hospital lighting
|
DIN-5035-4
|
1983
|
Artificial lighting of interiors; special recommendations for lighting educational establishments
|
DIN-5035-5
|
1987
|
Artificial Lighting of Interiors; Emergency Lighting December
|
DIN-5035-6
|
1990
|
Artificial lighting; measurement and evaluation
|
DIN-5035-7
|
1988
|
Artificial lighting of interiors; lighting of rooms with VDU work stations or VDU assisted workplace
|
DIN-50359-1
|
1997
|
Universal Hardness Testing of Metallic Materials - Test Method October
|
DIN-504
|
1973
|
Driving Components; Eye-Mounted Bearings July
|
DIN-50431
|
1988
|
Testing of Semiconductor Materials; Measurement of the Resistivity of Silicon or Germanium Single Cr
|
DIN-50434
|
1986
|
Testing of Materials for Semiconductor Technology; Detection of Crystal Defects in Monocrystalline S
|
DIN-50435
|
1988
|
Testing of Semiconductor Materials; Determination of the Radial Resistivity Variation of Silicon or
|
DIN-50438-1
|
1995
|
Determination of Interstitial Oxygen Content of Silicon Intended for Use in Semiconductor Technology
|
DIN-50438-3
|
1984
|
Testing of Materials for Use in Semiconductor Technology; Determination of Interstitial Atomic Boron
|
DIN-50441-1
|
1996
|
Determining the Dimensions of Semiconductor Wafers Part 1: Thickness and Thickness Variation July
|
DIN-50443-1
|
1988
|
Testing of Materials for Use in Semiconductor Technology; Detection of Crystal Defects and Inhomogen
|
DIN-50443-2
|
1994
|
Detection of Defects and Inhomogeneities in Monocrystalline III-V Compound Semiconductors by X-Ray T
|
DIN-50445
|
1992
|
Contactless Determination of the Resistivity of Homogeneously-Doped Semiconductor Slices with the Ed
|
DIN-50446
|
1995
|
Identification of Defects and Determination of Their Densities in Silicon Epitaxial Layers September
|
DIN-50447
|
1995
|
Contactless Measurement of Sheet Resistance of Semiconductor Layers Using the Eddy Current Induction
|
DIN-50448
|
1998
|
Determination of the Resistivity of Semi-Insulating Semiconductors Using a Capacitor January
|
DIN-50449-1
|
1997
|
Determination of Impurities in III-V Compound Semiconductors by Infrared Absorption Part 1: Carbon i
|
DIN-50449-2
|
1998
|
Determination of Impurities in III-V Compound Semiconductors by Infrared Absorption Part 2: Boron in
|
DIN-50450-6
|
1994
|
Determination of CO and CO2 Impurities in Nitrogen; Used as Carrier Gas and Doping Gas in Semiconduc
|
DIN-50450-7
|
1995
|
Determination of CO and H2 Impurities in Nitrogen; Used as Carrier Gas and Doping Gas in Semiconduct
|
DIN-50451-2
|
1990
|
Determination of Cobalt, Chromium, Copper, Iron and Nickel as Impurities in Hydrofluoric Acid for Us
|
DIN-50452-1
|
1995
|
Particle Analysis of Liquids for Use in Semiconductor Technology by the Microscopic Particle Determi
|
DIN-50452-2
|
1991
|
Particle Analysis of Liquids for Use in Semiconductor Technology Using Optical Particle Counters (Ma
|
DIN-50453-1
|
1990
|
Gravimetric Determination of Etch Rate of Mixtures for Etching Silicon Single Crystals for Use in Se
|
DIN-50453-2
|
1990
|
Spectrophotometric Determination of Etch Rate of Mixtures for Etching Silicon Dioxide Coatings for U
|
DIN-50460
|
1988
|
Determination of Magnetic Properties of Soft Magnetic Materials; General, Terminology and Principles
|
DIN-50463
|
1985
|
Testing of Steel; Determination of the Density of Iron/Silicon Alloy Magnetic Sheet (July)
|
DIN-50470
|
1980
|
Testing of Permanent Magnet Materials; Determination of the Demagnetization Curve and Permanent Perm
|
DIN-50502
|
1998
|
Determination of Copper Content of Unalloyed Copper Containing Not Less Than 99,90% of Copper May
|
DIN-50503
|
1998
|
Determination of Copper Content of Wrought and Cast Copper Alloys May
|
DIN-50511
|
1994
|
Determination of Phosphorus Content of Copper and Copper Alloys by the Molybdovanadate Spectrometric
|
DIN-50551
|
1990
|
Determination of the Lead, Cadmium and Copper Content of Zinc and Zinc Alloys by Atomic Absorption S
|
DIN-50600
|
1980
|
Testing of Metallic Materials; Metallographic Micrographs; Picture Scales and Formats (Mar)
|
DIN-50601
|
1985
|
Metallographic Examination; Determination of the Ferritic or Austenitic Grain Size of Steel and Ferr
|
DIN-50602
|
1985
|
Metallographic Examination; Microscopic Examination of Special Steels Using Standard Diagrams to Ass
|
DIN-508
|
1997
|
T-Nuts January
|
DIN-509
|
1966
|
Undercuts August
|
DIN-50900-1
|
1982
|
Corrosion of Metals; Terminology; General Concepts (Apr)
|
DIN-50902
|
1994
|
Protective Coatings on Metals; Concepts, Application Methods and Surface Preparation (Jul)
|
DIN-50903
|
1967
|
Metallic Coatings; Pores, Inclusions, Blisters and Cracks; Definitions (Jan)
|