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BSI-PD-R217-020
|
2002
|
Electronic System Specification Languages - VHDL Modelling Guidelines (S)
|
|
BSI-PD-R217-021
|
2002
|
Electronic System Specification Languages - Standard Method for Building VHDL Models of Component Li
|
|
BSI-PP-666
|
1991
|
Language of Labels (H)
|
|
BSI-PP-7302
|
1987
|
Compendium of British Standards for Design and Technology in Schools (Also Included in PP 7311 Repla
|
|
BSI-PP-7307
|
1989
|
Graphical Symbols for Use in Schools and Colleges (Also Included in PP 7311 Replaces BS PP 7307: 198
|
|
BSI-PP-7308
|
1986
|
Engineering Drawing Practice for Schools and Colleges (Also Included in PP 7311 Replaces BS PD 7308:
|
|
BSI-PP-7309
|
1985
|
Introduction to the Tolerancing of Functional Length Dimensions
|
|
BSI-PP-7310
|
1990
|
Anthropometrics An Introduction (Replaces BS PP 7310: 1984)
|
|
BSI-PP-7312
|
1998
|
Extracts from British Standards for Students of Structural Design (G)
|
|
BSI-PP-7314
|
1992
|
Projection Systems Compared
|
|
BSI-PP-7316
|
1986
|
Streamflow Measurement
|
|
BSI-PP-7317
|
1987
|
Ergonomics-Standards and Guidelines for Designers (G)
|
|
BSI-PP-7318
|
1988
|
Materials Testing
|
|
BSI-PP-7319
|
1989
|
Construction Drawing Practice for Universities, Polytechnics and Colleges
|
|
BSI-PP-7320
|
1988
|
Construction Drawing Practice for Schools (Replaces BS PD 7301: 1981)
|
|
BSI-PP-787
|
1988
|
Standards and Textiles (Replaces BS PP 777: 1981 and BS PP 777A: 1981)
|
|
BSI-QC-001002
|
1386
|
Amd 1 Rules of Procedure of the IEC Quality Assessment System for Electronic Components (IECQ) (AMD
|
|
BSI-QC-001002-2
|
1997
|
Rules of Procedure of the IEC Quality Assessment System for Electronic Components (IECQ) Part 2: Doc
|
|
BSI-QC-001002-3
|
1997
|
Rules of Procedure of the IEC Quality Assessment System for Electronic Components (IECQ) Part 3. App
|
|
BSI-QC-010000
|
1993
|
Amd 1 Connectors for Frequencies Below 3 MHz for Use with Printed Boards - Part 1: Generic Specifica
|
|
BSI-QC-030000
|
1993
|
Rectangular Connectors for Frequencies Below 3 MHz Part 1: Generic Specification - General Requireme
|
|
BSI-QC12
|
1996
|
Process Assessment Schedule for Printed Board Design Facilities (T)
|
|
BSI-QC-160000-1
|
1987
|
Electromechanical All-Or-Nothing Relays. Electrical Relays: Generic Specification Part 1: Test and M
|
|
BSI-QC-160000-2
|
1987
|
Electromechanical All-Or-Nothing Relays. Electrical Relays: Generic Specification Part 2: Quality As
|
|
BSI-QC-160100
|
1987
|
Electromechanical All-Or-Nothing Relays. Electrical Relays: Sectional Specification
|
|
BSI-QC-160101
|
1987
|
Electromechanical All-Or-Nothing Relays Test Schedules 1, 2, and 3: Blank Detail Specification
|
|
BSI-QC-210000
|
1996
|
Technology Approval Schedules Requirements Under the IEC Quality Assessment System for Electronic Co
|
|
BSI-QC-221100
|
1997
|
Radio-Frequency Connectors RF Coaxial Connectors with Inner Diameter of Outer Conductor 4,13 mm (0,1
|
|
BSI-QC-221200
|
1997
|
Amd 1 Radio-Frequency Connectors - RF Coaxial Connectors with Inner Diameter of Outer Conductor 6,5
|
|
BSI-QC-221300
|
1997
|
Radio-Frequency Connectors RF Coaxial Connectors with Inner Diameter of Outer Conductor 3 mm (0,12 i
|
|
BSI-QC-221400
|
1997
|
Radio-Frequency Connectors RF Coaxial Connectors with Inner Diameter of Outer Conductor 3 mm (0,12 i
|
|
BSI-QC-222000
|
1996
|
Radio-Frequency Connectors RF Coaxial Connectors with Inner Diameter of Outer Conductor 6,5 mm (0,25
|
|
BSI-QC-222100
|
1997
|
Radio-Frequency Connectors RF Coaxial Connectors with Inner Diameter of Outer Conductor 7 mm (0,276
|
|
BSI-QC-222400
|
1997
|
Radio-Frequency Connectors RF Coaxial Connectors with Inner Diameter of Outer Conductor 5,6 mm (0,22
|
|
BSI-QC-300000
|
1983
|
Amd 1 Specification for Harmonized System of Quality Assessment for Electronic Components. Fixed Cap
|
|
BSI-QC-300200
|
1983
|
Amd 1 Fixed Capacitors for Use in Electronic Equipment Sectional Specification: Fixed Tantalum Capac
|
|
BSI-QC-300201
|
1985
|
Amd 1 Fixed Tantalum Capacitors with Solid Electrolyte and Porous Anode. Assessment Level E (Formerl
|
|
BSI-QC-300202
|
1985
|
Amd 1 Fixed Tantalum Capacitors with Non- Solid Electrolyte and Porous Anide. Assessment Level E (Fo
|
|
BSI-QC-300203
|
1985
|
Fixed Tantalum Capacitors with Non- Solid Electrolyte and Foil Electrode. Assessment Level E (Former
|
|
BSI-QC-300301
|
1993
|
Blank Detail Specification Fixed Capacitors for Use in Electronic Equipment. Part 4: Blank Detail Sp
|
|
BSI-QC-300400
|
1983
|
Amd 1 Fixed Capacitors for Use in Electronic Equipment Sectional Spec: Fixed Metallized Polyethylene
|
|
BSI-QC-300401
|
1984
|
Amd 1 Fixed Metallized Polyethylene Terephthalate Film Dielectric DC Capacitors Assessment Level E (
|
|
BSI-QC-300701
|
1993
|
Corr 1 Harmonized System of Quality Assessment for Elecronic Components - Fixed Capacitors for Use i
|
|
BSI-QC-301200
|
1983
|
Amd 1 Sectional Specification: Fixed Metallized Polypropylene Film Dielectric d.c. Capacitors (Previ
|
|
BSI-QC-301201
|
1984
|
Amd 1 Fixed Metallized Polypropylene Film Dielectric dc Capacitors Assessment Level E (Formerly BS 9
|
|
BSI-QC-390000
|
1992
|
Fixed Film Resistor Networks for Use in Electronic Equipment Generic Specification (IEC 1045-1: 1991
|
|
BSI-QC-390100
|
1992
|
Fixed Film Resistor Networks for Use in Electronic Equipment Sectional Specification for Film Resist
|
|
BSI-QC-390101
|
1992
|
Film Resistor Networks of Assessed Quality on the Basis of Capability Approval Procedure Assessment
|
|
BSI-QC-40000
|
1999
|
Fixed resistors for use in electronic equipment generic specification
|
|
BSI-QC-400102
|
1992
|
Fixed Low-Power Non-Wirewound Resistors Assessment Level F (IEC 115-2-2: 1992)
|
